SELSE Workshop

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SELSE 5 Program

A PDF copy of this program is available. Links to the most papers and some presentations are provided below. SELSE is an informal workshop. To encourage widespread participation authors are given the option to not have their papers or presentations published on this web site. We thank all authors for their participation.

Day 1 - March 24th, 2009
Stanford University

Continental Breakfast and Registration
Welcome and Introduction from General Co-Chair and Committee

Session I: System Vulnerability and Workload Effects
Chair: Rakesh Kumar (UIUC)

The Effect of Input Data on Program Vulnerability. Paper

Vilas Sridharan and David Kaeli.

Quantized AVF: A Means of Capturing Vulnerability Variations over Small Windows of Time. Paper Slides
Arijit Biswas, Niranjan Soundararajan, Shubhendu Mukherjee and Sudhanva Gurumurthi.

Soft Error Effect and Register Criticality Evaluations: Past, Present and Future.  Paper Slides
Régis Leveugle, Laurence Pierre, Paolo Maistri and Renaud Clavel.

Session II: Applications / Case Studies
Chair : Charles Recchia (Intel)

Evaluation of Low-Cost Detection and Recovery of Soft Errors in an ABS controller. Presentations

Daniel Skarin and Johan Karlsson

A Case Study of the Soft Errors Observed in I/O Adapters.

Anh Dang, Pia Sanda, Ricardo Mata and Subhasish Mitra.

Platform Neutron Testing for Single Event Upset (SEU). Paper  Slides

Tsu-Yau Chuang, Eric Schmidt and Shi-Jie Wen.

Poster Session I

Adapting to Intra-Die Variations in Transient Fault Susceptibilities. Paper
Kenneth Zick and John Hayes.

Testing the Critical Operating Point (COP) Hypothesis using FPGA Emulation of Timing Errors in Overscaled Soft-Processors.  Paper
Sriram Narayanan, Galen Lyle, Rakesh Kumar and Douglas L. Jones.

Thermal Management in Reliably Overclocked Systems. Paper
Prem Kumar Ramesh, Viswanathan Subramanian and Arun Somani

Analysis of a Multiple Cell Upset Failure Model for Memories. Paper
Sanghyeon Baeg, Pedro Reviriego, Juan Antonio Maestro, ShiJie Wen and Richard Wong.

Single-Threaded Mode AVF Prediction During Redundant Execution. Paper
Blake C. Sutton and Sudhanva Gurumurthi.

Exploring the Synergy of Emerging Workloads and Silicon Reliability Trends. Paper
Marc de Kruiff and Karu Sankaralingam.

Session III: SER Measurement and Modeling
Chair: Steve Walstra (Intel)

Neutron Beam Irradiation Study of Workload Dependence of SER in a Microprocessor. Paper Slides
Ted Hong, Sriram Narayanan, Galen Lyle, Rakesh Kumar and Douglas L. Jones.

Trends from Ten Years of Soft Error Experimentation. Paper Slides
Anand Dixit, Raymond Heald and Alan Wood.

Comparison of Alpha-particle and Neutron-induced Combinational and Sequential Logic Error Rates at the 32nm Technology Node.
Balkaran Gill, Norbert Seifert and Victor Zia.

Soft-Error Cross-Section Mapping and Rate Prediction using Accurate Simulation. Paper
Klas Lilja.


Panel: “System Specifications of Soft Error Performance”

Moderator:   Adrian Evans (Cisco)
Panelists: Pia Sanda (IBM)

Allan Silburt (Cisco) Slides

Yaakov Kogan (AT&T)

Sarah Michalak (LANL) Slides

Birds of a Feather Sessions

Jeff Wilkinson (Medtronic)

Session A: Embedded systems derating: How many soft errors lead to system failures in a small system?

Studies have been published describing the derating values to use to predict the fraction of soft-errors that lead to system errors. Most of these studies have concentrated on this question using large scale computer systems that are highly optimized for soft-error tolerance. Two recent papers on embedded system derating suggest that the values are quite different for simpler microprocessor architectures.
Participants will be asked to consider:
-    Is there a real difference between these classes of systems?

-    How should derating be defined for embedded systems?
-    What projects or avenues of research are likely to be profitable to further investigation of this topic?

Session B & C: TBD
Dinner and Reception

Day 2 - March 25th, 2009
Stanford University
Continental Breakfast
Report From Birds of Feather Sessions
Session IV: Mitigation Techniques – Logic
Chair: Charles Slayman (Sun)

A Coarse-Grained Dynamically Reconfigurable Architecture Enabling Flexible Reliability. Paper Slides

Dawood Alnajjar, Younghun Ko, Takashi Imagawa, Masayuki Hiromoto, Yukio Mitsuyama, Masanori Hashimoto, Hiroyuki Ochi and Takao Onoye.

Fault-Tolerant Resynthesis for Dual-Output LUTs. Papers Slides

Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He and Minming Li.

Session V: Microprocessors
Chair: Jim Tschanz (Intel)

A Low-Overhead Technique to Protect the Issue Control Logic Against Soft Errors. Paper

Javier Carretero, Xavier Vera, Jaume Abella, Pedro Chaparro and Antonio González

Voltage Noise: Why It’s Bad, and What To Do About It. Paper

Vijay Janapa Reddi, Meeta S. Gupta, Krishna K. Rangan, Glenn Holloway, Gu-Yeon Wei, Michael D. Smith and David Brooks

A Detector for Harmful Errors. Paper Slides
Jing Yu and Maria Garzarán

Poster Session II

NBTI-Aware Dynamic Instruction Scheduling. Paper

Taniya Siddiqua and Sudhanva Gurumurthi.

Implementation and Validation of a Low-Cost Single-Event Latchup Mitigation Scheme.  Paper
Michael Nicolaidis, Kholdoun Torki, Federico Natali, Kader Belhaddad and Dan Alexandrescu.

A Foundation for the Accurate Prediction of the Soft Error Vulnerability of Scientific Applications
Greg Bronevetsky, Bronis R. de Supinski and Martin Schulz.

Soft-error Mitigation at the Architecture-Level Using Berger Codes and Instruction Repetition. Paper
Daniel Limbrick, Edward Ossi, Bharat Bhuva and William Robinson.

3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits.
Rajesh Garg and Sunil Khatri.


Invited Talk: Helmet Puchner, Cypress Semiconductor
“On The Accuracy of Accelerated and Life Soft Error Testing" Slides

Session VI: Mitigation Techniques – Arrays and Sequentials
Chair: Terry Garyet (Freescale)

Soft Error Mitigation Schemes for High Performance and Aggressive Designs. Paper Slides

Naga Durga Prasad Avirneni, Viswanathan Subramanian and Arun Somani.

Protecting Prediction Arrays against Faults. Paper
Yiannakis Sazeides, Costas Kourouyiannis, Nikolas Ladas and Veerle Desmet.

Modeling SRAM Failure Rates to Enable Fast, Dense, Low-Power Caches. Paper Slides
Jangwoo Kim, Mark McCartney, Ken Mai and Babak Falsafi.

Closing Discussion