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SELSE 9 Program

  SELSE 9

The SELSE Program Committee is proud to announce our keynote speakers for SELSE-9!

Keynotes:

Keynote I: Silicon Today, Silicon Tomorrow
Dr. Sani R. Nassif (IBM).
 

 Keynote II: Hardware errors at Cloud-scale: Ignore, Retry, or Abort?
Mark Shaw (Microsoft's GFS).

Keynote III: Emerging challenges in high performance computing: Resilience and the science of embracing failure
Dr. John T. Daly (CEC).
 

 

Links to papers and presentations will be provided after the workshop. SELSE is an informal workshop. To encourage widespread participation authors are given the option to not have their papers or presentations published on this web site. We thank all authors for their participation.

Day 1 - March 26th, 2013 - Stanford University

08:00 - 08:45 Continental Breakfast and Registration 

08:45 - 09:00 Welcome Remarks: SELSE General and Program Chairs

09:00 - 09:45 Session I: Keynote Speech (Chair: Jeff Wilkinson (Medtronic)) 

Silicon Today, Silicon Tomorrow
Dr. Sani Nassif (IBM)

09:45 - 10:45 Session II: Multiple Errors (Chair: Steve Walstra (Intel))

Impact of Cell Distance and Well Contact Density on Neutron-Induced Multiple Cell Upsets    
Jun Furuta (Kyoto University), Kazutoshi Kobayashi (Kyoto Institute of Technology) and Hidetoshi Onodera (Kyoto University)

Single-Event Multiple Transients (SEMT) : Circuit Characterization and Analysis  
Bradley Kiddie (Vanderbilt University), William Robinson (Vanderbilt University) and Daniel Limbrick (Georgia Tech)

10:45 - 11:00 Coffee Break

11:00 - 12:00 Session III: SER of Memory Cells (Chair: Anand Dixit (Oracle))

Soft Error Study of Memory Cells at 28nm   Slides
Austin Lesea (Xilinx)

Neutron and Alpha Soft Error Rate Simulations for Memory and Logic Devices at Advanced Technologies  
Yi-Pin Fang (TSMC), Anthony S. Oates (TSMC), Kader Belhaddad (IROC), Vincent Correas (IROC), Issam Nofal (IROC) and Olivier Lauzeral (IROC)

12:00 - 13:00 Lunch

13:00 - 14:15 Session IV: Poster session (Chair: Vilas Sridharan (AMD))

Modelling the Performance Vulnerability of Arrays to Permanent Faults  
Damien Hardy (IRISA), Isidoros Sideris (U. Cyprus), Nikolas Ladas (U. Cyprus) and Yiannakis Sazeides (U. Cyprus) 

Replication-Free Single-Event Transient (SET) Detection for Eliminating Silent Data Corruption in CMOS Logic  
Evgeni Krimer (U. Texas, Austin), Joseph Crop (U. Texas, Austin), Mattan Erez (U. Texas, Austin) and Patrick Chiang (Oregon State University) 

SCRIBE: A Hardware Infrastructure Enabling Fine-Grained Software Layer Diagnosis  
Majid Dadashi (UBC), Layali Rashid (UBC) and Karthik Pattabiraman (UBC) 

Benchmarking the Hardware Error Sensitivity of Machine Instructions  
Behrooz Sangchoolie (Chalmers University), Fatemeh Ayatolahi (Chalmers University), Raul Barbosa (Chalmers University), Roger Johansson (Chalmers University) and Johan Karlsson (Chalmers University)

Towards a Hierarchical and Scalable Approach for Modeling the Effects of SETs  
Enrico Costenaro (IROC), Adrian Evans (IROC), Dan Alexandrescu (IROC), Liang Chen (KIT), Mehdi Tahoori (KIT) and Michael Nicolaidis (TIMA)

A Low-Power and Area-Efficient Radiation-Hard Redundant Flip-Flop: DICE ACFF  
Kanto Kubota (Kyoto Institute of Technology), Masaki Masuda (Kyoto Institute of Technology) and Kazutoshi Kobayashi (Kyoto Institute of Technology) 

Perturbation-Immune Radiation-Hardened PLL with a Switchable DMR Structure  
Sinnyoung Kim (Kyoto University), Akira Tsuchiya (Kyoto University) and Hidetoshi Onodera (Kyoto University)

14:15 - 14:45 Coffee Break

14:45 - 16:45 Session V: System Level Testing and Case Studies (Chair: Yiannakis Sazeides (U. Cyprus))

Field Testing of Production and Decommissioned High-Performance Computing Platforms at Los Alamos National Laboratory  
Sarah Michalak (LANL), William Rust (LANL), John Dalu (US DoD), Andrew Dubois (LANL) and David Dubois (LANL) 

Soft Error Resiliency Characterization and Improvement on IBM BlueGene/Q Processor Using Accelerated Proton Irradiation  
Chen-Yong Cher (IBM), K Paul Muller (IBM), Ruud A. Haring (IBM), David L. Satterfield (IBM), Thomas E. Musta (IBM), Thomas M. Gooding (IBM), Kristan D. Davis (IBM), Marc B. Dombrowa (IBM), Gerard V. Kopcsay (IBM), Robert M. Senger (IBM), Yutaka Sugawara (IBM) and Krishnan Sugavanam (IBM)

Experimental Evaluation of Neutron-Induced Effects in Graphic Processing Units   Slides
Paolo Rech (UFRGS) and Luigi Carro (UFRGS)

Cosmic Ray Effects on Cellphone, Laptop, and USB Flash Drive Applications  
Yuyuan Chen (Lynbrook High School)

16:45 - 17:30 Session VI: Keynote Speech (Chair: Arijit Biswas (Intel)) 

Hardware Errors at Cloud-Scale: Ignore, Retry, or Abort?
Mark Shaw (Microsoft GFS)

17:30              Reception and Banquet

 

Day 2 - March 27th, 2013 - Stanford University

08:00 - 08:30 Breakfast

08:30 - 10:00 Session VII: Reliability Modeling and Field Studies (Chair: Sarah Michalak (LANL)) 

Cross-Layer Dependability Modeling and Abstraction in Systems on Chip    Slides
Andreas Herkersdorf (TU München), Veit Kleeberger (TU München), Sani Nassif (IBM), Ulf Schlichtmann (TU München), Christian Weis (TU Kaiserslautern), Norbert Wehn (TU Kaiserslautern), et al. 

Reliability Models for Double Chipkill Detect/Correct Memory Systems  
Xun Jian (UIUC), Sean Blanchard (LANL), Nathan Debardeleben (LANL), Vilas Sridharan (AMD) and Rakesh Kumar (UIUC)

Analysis of Memory Errors from Large-Scale Field Data Collection   Slides
Taniya Siddiqua (Intel), Athanasios Papathanasiou (Aster Data), Arijit Biswas (Intel) and Sudhanva Gurumurthi (U. Virginia)

10:00 - 10:15 Coffee Break

10:15 - 11:15 Session VIII: Measurement of SER and Variability (Chair: Charles Slayman (Cisco)) 

Laser-Assisted SER Estimation in 22nm Tri-Gate CMOS Technology  
Ricardo Ascazubi (Intel), Georgia Modoran (Intel) and Balkaran Gill (Intel) 

PulSER: Measuring design robustness and delay variability in 28nm  
Anand Dixit (Oracle), Robert Masleid (Oracle), Howard Hsu (Oracle), Jun Guo (Oracle), Hogan Nguyen (Oracle), Norberto Reyes (Oracle) and Jason Hart (Oracle)

11:15 - 12:15 Session IX: Panel Discussion

Topic: Reliability Roadmaps: Are the Predictions Getting Better or Worse?
Moderator: Adrian Evans (IROC)
Panelists:  
Yi-Pin Fang (TSMC)
Austin Lesea (Xilinx)
Subhasish Mitra (Stanford)
Shi-Jie Wen (Cisco Systems) 
Alan Wood (Oracle)  

12:15 - 13:15 Lunch

13:15 - 14:00 Session X: Keynote Speech (Chair: Alan Wood (Oracle))

Emerging Challenges in High Performance Computing: Resilience and the Science of Embracing Failure
John T. Daly (CEC)

14:00 - 15:00 Session XI: Error Detection, Mitigation and Repair Techniques (Chair: Helia Naeimi (Intel)) 

Self-Repair of Uncore Components in Robust System-on-Chips  
Yanjing Li (Stanford), Eric Cheng (Stanford), Samy Makar (Stanford) and Subhasish Mitra (Stanford)

Generating Control Logic for Optimized Soft Error Resilience  
Wenchao Li (UC Berkeley), Susmit Jha (Intel) and Sanjit A. Seshia (UC Berkeley)

15:00 - 15:15 Coffee Break

15:15 - 16:15 Session XII: Effects of Software on Reliability (Chair: Daniel Limbrick (Georgia Tech)) 

LLFI: An Intermediate Code Level Fault Injector For Soft Computing Applications  
Anna Thomas (UBC) and Karthik Pattabiraman (UBC)

Measuring Code Optimization Impact on Voltage Noise  
Svilen Kanev (Harvard), Timothy Jones (Cambridge), Gu-Yeon Wei (Harvard), David Brooks (Harvard) and Vijay Janapa Reddi (U.Texas, Austin)

16:15 - 17:15 Session XIII: AVF / Fault Injection (Chair: Karthik Pattabiraman (UBC)) 

Understanding Inaccuracies of Soft Error Injection Techniques  
Hyungmin Cho (Stanford), Shahrzad Mirkhani (U. Texas, Austin), Chen-Yong Cher (IBM), Jacob A. Abraham (U. Texas, Austin) and Subhasish Mitra (Stanford)

Architectural Vulnerability Modeling and Analysis of Integrated Graphics Processors  
Hyeran Jeon (USC), Mark Wilkening (AMD), Vilas Sridharan (AMD), Sudhanva Gurumurthi (AMD) and Gabriel Loh (AMD)

17:15 - 17:30 Closing Remarks